Model-based inspection system for component boards
- 31 December 1984
- journal article
- Published by Elsevier in Pattern Recognition
- Vol. 17 (1) , 135-140
- https://doi.org/10.1016/0031-3203(84)90040-2
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Using circular symmetry and intensity profiles for computer vision inspectionComputer Graphics and Image Processing, 1981
- A process for detecting defects in complicated patternsComputer Graphics and Image Processing, 1973