High-resolution electron microscopy of defects in W4Nb26O77
- 1 February 1985
- journal article
- Published by Elsevier in Journal of Solid State Chemistry
- Vol. 56 (2) , 236-240
- https://doi.org/10.1016/0022-4596(85)90061-1
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Multislice formula for inclined illuminationActa Crystallographica Section A, 1982
- Multiple phases in the system MgF2Nb2O5 an electron microscope study of intergrowths, defects, and disordered crystalsJournal of Solid State Chemistry, 1974
- High resolution electron microscopy of TiO2·7Nb2O5Journal of Solid State Chemistry, 1973
- Direct observation of lattice defects inH-Nb2O5by high resolution electron microscopyActa Crystallographica Section A, 1973
- Multiple phase formation in the binary system Nb2O5–WO3. VI. Electron microscopic observation and evaluation of non-periodic shear structuresActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969
- Multiple phase formation in the binary system Nb2O5–WO3. The structure of W4Nb26O77, an ordered intergrowth of the adjoining compounds WNb12O33and W3Nb14O44Acta Crystallographica, 1966