Characterization of surface exchange reactions used to grow compound films
- 1 February 1981
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 38 (3) , 131-132
- https://doi.org/10.1063/1.92274
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A study of ZnTe films grown on glass substrates using an atomic layer evaporation methodThin Solid Films, 1980