Ellipsometry as a diagnostic for the measurement of erosion and redeposition in a tokamak
- 1 December 1992
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 196-198, 184-188
- https://doi.org/10.1016/s0022-3115(06)80028-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Picosecond laser heating and melting of graphiteInternational Journal of Thermophysics, 1990
- Erosion and deposition processes in tokamaksFusion Engineering and Design, 1989
- Ellipsometer measurement of thickness and optical properties of thin absorbing filmsApplied Surface Science, 1988
- Ueber Oberflächenschichten. II. TheilAnnalen der Physik, 1889
- Ueber Oberflächenschichten. I. TheilAnnalen der Physik, 1889