Experimental study of X-ray diffraction under specular reflection conditions

• 1 May 1984
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
• Vol. 40  (3) , 225-228
• https://doi.org/10.1107/s0108767384000477

Abstract

Keywords

• SILICON
• DIFFUSE SCATTERING
• DIFFRACTED
• SPECULARLY REFLECTED
• SPECULAR REFLECTION
• CRYSTALS