Characterization of ion-nitrided titanium layers by means of x-ray microdiffractometry
- 28 February 1990
- journal article
- Published by Elsevier in Surface and Coatings Technology
- Vol. 41 (1) , 83-91
- https://doi.org/10.1016/0257-8972(90)90132-v
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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