2nd Generation 600V SiC Schottky Diodes Use Merged pn/Schottky Structure for Surge Overload Protection

Publisher Website

28 April 2006

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 170-173
https://doi.org/10.1109/apec.2006.1620534

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability
Published by Test accounts ,2005
Performance evaluation of CoolMOS/sup /spl trade// and SiC diode for single-phase power factor correction applications
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2004