Effect of thin-film thickness on Abelès-type index measurements
- 1 January 1974
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 64 (1) , 108-109
- https://doi.org/10.1364/josa.64.000108
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Effect of Refractive Index Gradients on Index Measurement by the Abeles MethodApplied Optics, 1972
- Polarization State of Thin-Film Reflection*Journal of the Optical Society of America, 1965
- Determination of the Refractive Index of Thin Dielectric Films*Journal of the Optical Society of America, 1964
- The Brewsterian Angle and Refractive IndicesJournal of the Optical Society of America, 1941