Study of ultra-thin hydrogen silsesquioxane films using X-ray reflectivity
- 1 January 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 312 (1-2) , 73-77
- https://doi.org/10.1016/s0040-6090(97)00587-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Anisotropy of thermal expansion of thin polyimide filmsThin Solid Films, 1990
- X-ray and neutron reflectivity for the investigation of polymersMaterials Science Reports, 1990
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954