Characterization of Multiple Parallel Transmission Lines Using Time Domain Reflectometry

1 January 1969

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement

Vol. 18 (3) , 166-171
https://doi.org/10.1109/TIM.1969.4313795

Abstract

Two methods of using time domain reflectometry for the characterization of a system of multiple parallel transmission lines are described. The two methods are the reflection method and the direct method. The selection of a method depends on the accuracy required and the property of the system of transmission lines to be measured: [Y0], [Z0], [C], or [L].

Keywords

TRANSMISSION LINES
REFLECTOMETRY
CONDUCTORS
TRANSMISSION LINE THEORY
TRANSMISSION LINE MATRIX METHODS
TRANSMISSION LINE MEASUREMENTS
MULTICONDUCTOR TRANSMISSION LINES
SYMMETRIC MATRICES
PROPAGATION LOSSES
MEASUREMENT TECHNIQUES

This publication has 1 reference indexed in Scilit:

Time-domain analysis of multiple parallel transmission lines by means of equivalent circuits
Electronics Letters, 1967