Low Field Time Dependent Dielectric Integrity

• 1 April 1979
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• No. 07350791,p. 8-12
• https://doi.org/10.1109/irps.1979.362864

Abstract

Keywords

• TESTING
• VEHICLES
• TEMPERATURE
• BREAKDOWN VOLTAGE
• DIELECTRIC DEVICES
• DIELECTRIC SUBSTRATES
• INTERFERENCE
• STATISTICS
• FETS
• SURFACES