On the Sensitivity of the Fluorescence EXAFS
- 1 November 1982
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 21 (11A) , L687
- https://doi.org/10.1143/jjap.21.l687
Abstract
The sensitivity of the fluorescence EXAFS is discussed on the basis of a phenomenological theory and shown to be estimated by a parameter defined by absorption coefficients. Measurements of the fluorescence EXAFS and of the transmission EXAFS are performed on Fe, Cr, and Ni contained in stainless steel SUS 304 with different ratios. Both theoretical and experimental results exhibit a high sensitivity of the fluorescence EXAFS for a dilute component less than about 10%.Keywords
This publication has 3 references indexed in Scilit:
- Thickness effect on the extended-x-ray-absorption-fine-structure amplitudePhysical Review B, 1981
- Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin filmsSolid State Communications, 1977
- New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine StructurePhysical Review Letters, 1971