Enhancement of Surface Plasmon excitation by Low-Energy Electron due to Surface Resonance on Si (001)–2×1
- 1 April 1982
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 21 (4A) , L189-191
- https://doi.org/10.1143/jjap.21.l189
Abstract
ILEED measurements by electron energy analyser were performed to investigate the diffraction effect on inelastic scattering related to surface and bulk plasmon excitations. The relation between elastic and inelastic I–V curves of the 00-beam is discussed. A kinematical two-step picture is suitable for Bragg peaks, and two peaks due to DL (Diffraction before Loss) and LD processes are observed equally. For fractional order peaks, dynamical consideration is required, and the transition probability is affected by the symmetry between the initial and final states. Enhancement of surface plasmon excitation due to surface resonance was observed.Keywords
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