Isothermal frequency scan DLTS
- 16 April 1986
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 94 (2) , K119-K124
- https://doi.org/10.1002/pssa.2210940263
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974
- Capacitance-Voltage Measurements with a Mercury-Silicon DiodeJournal of the Electrochemical Society, 1972