Estimating fatigue lifetime of power-cycled solid-state switches
- 1 September 1970
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 17 (9) , 793-797
- https://doi.org/10.1109/t-ed.1970.17075
Abstract
A description is given of a method for estimating the fatigue lifetime of a solid-state power switch. The switch considered is a layered structure with a silicon wafer as a power-dissipating structure from which heat flows through a solder layer into a copper heat sink. Lifetime data and metallographic analyses are presented for devices operating at 80-, 60-, and 40-amperes rms with fatigue lifetimes in excess of 106cycles. The data are in substantial agreement with the theory.Keywords
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