Surface and bulk density of states analysis in a-Si:H by a new interpretation of PDS and CPM measurements
- 31 January 1991
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 77 (3) , 177-180
- https://doi.org/10.1016/0038-1098(91)90328-s
Abstract
No abstract availableKeywords
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