Combined Auger electron spectroscopy and electron impact desorption studies of silicon surfaces
- 31 August 1972
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 32 (2) , 459-465
- https://doi.org/10.1016/0039-6028(72)90172-0
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Electron-Stimulated Desorption as a Tool for Studies of Chemisorption: A ReviewJournal of Vacuum Science and Technology, 1971
- Auger electron spectroscopySurface Science, 1971
- Contaminants on chemically etched silicon surfaces: LEED-Auger methodSurface Science, 1970
- The Focusing of Charged Particles by a Spherical CondenserPhysical Review B, 1938