The effect of flux closure at the edges of thin cobalt films on electron microscope images

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Abstract
Electrons passing through thin films of cobalt are deflected by a Lorentz force which is due to the magnetization of the specimen. Electrons passing near or just outside the edge of the specimen can also be deflected by a Lorentz force, which arises from flux closure at the edges. There are three methods of demonstrating this deflection, each analogous to one of the usual methods of imaging domain walls in transmission electron microscopy. The methods are also similar to those used by Marton et al. (1949, 1954) and by Blackman and Grünbaum (1957), but in this case the size of the domains is about two orders of magnitude smaller, and the closure flux can be correlated with the actual domain structure near the edge.