Observations of growth defects in berlinite by high-temperature X-ray topography

1 December 1985

journal article
Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography

Vol. 18 (6) , 533-534
https://doi.org/10.1107/s0021889885010834

Abstract

Growth defects in a synthetic berlinite sample were studied at high temperature (300–500 K) by X-ray topography. Preliminary observations of contrast changes with temperature are reported.

Keywords

GROWTH DEFECTS
BERLINITE SAMPLE
CONTRAST CHANGES
PRELIMINARY OBSERVATIONS
TOPOGRAPHY GROWTH
BERLINITE BY HIGH
DEFECTS IN BERLINITE

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