What determines the probing depth of electron yield XAS?
- 1 February 1995
- journal article
- Published by Elsevier in Surface Science
- Vol. 324 (2-3) , L371-L377
- https://doi.org/10.1016/0039-6028(94)00779-9
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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