Curves for the Quantification of Mica/Smectite and Chlorite/Smectite Interstratifications by X-ray Powder Diffraction

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Abstract
X-ray powder diffraction intensities for many interstratified structures of mica/smectite and chlorite/smectite were calculated by changing combinations of probabilities and transition probabilities of two component layers, respectively. The calculated d-values were plotted with PMs and PsM as the axes of coordinates for mica/smectites (where M is a mica layer and S is a smectite layer). These d-values were then linked into equal d-value curves on a graph. Three equal d-value diagrams ranging from 32.5 to 24.5/~, from 15.4 to 10.25 ,~, and from 3.365 to 3.08 A were constructed for mica/smectites. Several diagrams were also constructed for mica/glycolated-smectites and chlorite/smectites using the same tech- niques. PMs and PsM values of mica/smectite producing 26.8- and 12.6-A reflections in its X-ray powder diffraction pattern were obtained from the coordinates of the intersection of the 26.8-A line of the first diagram and the 12.6-/k line of the second diagram. The components and stacking parameters of mica/ smectites and chlorite/smectites were estimated easily using these diagrams. Interstratified mica/smectites were quantified in the air-dry and glycolated states, and chlorite/smectites in the glycolated state. Stacking parameters obtained by this method agreed well with those obtained by MacEwan's method. Stacking parameters for Reichweite (R=0) and (R= 1) structures were obtained.

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