An efficient design of embedded memories and their testability analysis using Markov chains
- 7 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 389-400
- https://doi.org/10.1109/wafer.1989.47569
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- An efficient built-in self testing for random-access memoryIEEE Transactions on Industrial Electronics, 1989
- Built-in Self Testing of Embedded MemoriesIEEE Design & Test of Computers, 1986
- Diagnosis & Reliable Design of Digital SystemsPublished by Springer Nature ,1976