An approximate deconvolution for EELS quantification of thicker samples
- 31 December 1987
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 23 (1) , 109-114
- https://doi.org/10.1016/0304-3991(87)90231-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- A single-stage process for quantifying electron energy-loss spectraUltramicroscopy, 1985
- Quantitative microanalysis by electron energy-loss spectroscopy: Two correctionsUltramicroscopy, 1980
- K-shell ionization cross-sections for use in microanalysisUltramicroscopy, 1979
- Inelastic scattering of 80 keV electrons in amorphous carbonPhilosophical Magazine, 1975
- The electron energy loss spectrum and band structure of diamondPhilosophical Magazine, 1974