Interferometric measurements of high temperature objects by electronic speckle pattern interferometry
- 1 October 1985
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 24 (19) , 3167-3172
- https://doi.org/10.1364/ao.24.003167
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 4 references indexed in Scilit:
- The moiré method—A reviewExperimental Mechanics, 1982
- High Resolution Moire PhotographyOptical Engineering, 1982
- Electronic speckle pattern interferometryPhysics in Technology, 1980
- Use of chopped laser light in electronic speckle pattern interferometryApplied Optics, 1979