Analysis of three-dimensional software EIT phantoms by the finite element method

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Abstract
In electrical impedance tomography, two-dimensional (2D) finite element solutions are used in the imaging algorithms. It is assumed that a major part of the current flowing through the object is restricted to the measurement plane (i.e. the plane determined by the electrodes which are used for measuring voltage differences) and the current flowing elsewhere is negligible. However, there is usually a three-dimensional (3D) variation of the conductivity distribution and if there are regions of high contrast close to the measurement plane, the measured voltage values may be considerably affected. In this work a 3D finite element analysis is utilised to demonstrate the previously mentioned effects. Examples are given to show the measured voltage differences for conductivity distributions which are identical on the measurement plane but different elsewhere.

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