Electron position distribution measurements in the dynamic crossed-field photomultiplier
- 1 January 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 21 (1) , 11-15
- https://doi.org/10.1109/t-ed.1974.17855
Abstract
Direct measurements of the arrival position distributions of electrons on multiplication steps in the dynamic crossed-field photomultiplier (DCFP) are reported. These measurements were performed using special devices with slotted dynodes behind which a fluorescent screen was placed. The electron position distribution could then be observed on the fluorescent screen and photographed. These experiments have shown that under all normal operating conditions of the DCFP good spatial resolution (no overlap) of electrons on all multiplication steps can be achieved.Keywords
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