External field penetration effect on current-field characteristics of metal emitters
- 1 March 1995
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 13 (2) , 566-570
- https://doi.org/10.1116/1.587915
Abstract
Polarization and barrier potentials for the point charge at a metal–vacuum interface have been calculated in the Thomas–Fermi and random phase approximations taking into account spatial dispersion effects and quantum nature of conduction electrons. The effect of external field penetration into the metal on the barrier potential shape and emission current is demonstrated. Both isotropic (a spherical Fermi surface) and anisotropic (a flat Fermi surface) cases are considered. Comparison between these cases is made for equivalent conditions.Keywords
This publication has 0 references indexed in Scilit: