Relationships between surface states, finishing processes and engineering properties
- 15 December 1982
- Vol. 83 (2) , 241-250
- https://doi.org/10.1016/0043-1648(82)90180-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Some problems encountered in secondary ion emission applied to elementary analysisSurface Science, 1975
- X-Ray Measurements of Stacking Faults and Internal Strains in α-Cu-Zn and α-Cu-SnJournal of Applied Physics, 1965