Electron microscopic study of precipitates and defects in germanium and silicon
- 28 February 1965
- journal article
- Published by Elsevier in Acta Metallurgica
- Vol. 13 (2) , 115-123
- https://doi.org/10.1016/0001-6160(65)90161-6
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- On diffraction contrast from inclusionsPhilosophical Magazine, 1963
- Diffraction contrast from spherically symmetrical coherency strainsPhilosophical Magazine, 1963
- Direct observation of coherency strains in a copper-cobalt alloyPhilosophical Magazine, 1962
- The preparation of thin films of germanium and siliconBritish Journal of Applied Physics, 1961
- Donor equilibria in the germanium oxygen systemJournal of Physics and Chemistry of Solids, 1960
- On the Kinetics and Mechanism of the Precipitation of Lithium from GermaniumJournal of Applied Physics, 1960
- Theory of diffusion-limited precipitationJournal of Physics and Chemistry of Solids, 1958