A phenomenon associated with the abrasion of CrSiO cermet resistors
- 1 March 1968
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 1 (5) , 388-392
- https://doi.org/10.1016/0040-6090(68)90029-1
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Resistivity and Structure of Cr–SiO Cermet FilmsJournal of Vacuum Science and Technology, 1967
- Electrical Conduction Mechanism in Ultrathin, Evaporated Metal FilmsJournal of Applied Physics, 1962