Depth profile XRD analysis for characterisation of solid-state amorphisation in the bilayer nickel-titanium system
- 30 June 1992
- journal article
- Published by Elsevier in Materials Letters
- Vol. 14 (1) , 67-71
- https://doi.org/10.1016/0167-577x(92)90107-u
Abstract
No abstract availableKeywords
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