Tension-tension fatigue of copper thin films

• 31 December 1998
• journal article
• Published by Elsevier in International Journal of Fatigue
• Vol. 20  (3) , 203-209
• https://doi.org/10.1016/s0142-1123(97)00080-7

Abstract

Keywords

• CLOSED-LOOP TESTING
• CYCLIC
• DISPLACEMENT
• ENDURANCE
• FORCE
• PIEZOELECTRIC
• S-N CURVE
• SERVO
• STRAIN
• STRESS