Polarization of porous silicon luminescence

Abstract
The polarization characteristics of light emitting porous Si films is investigated. The degree of polarization increases to well over 20% when the excitation wavelength is at the blue edge of the emission band and decreases with decreasing excitation wavelength. The steady-state value of the degree of polarization is established in less than 1 μs. The experimental results bear qualitative agreement with a quantum-wire model.

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