Low-energy electron diffraction as a surface probe

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Abstract
The viability of LEED as a tool for surface crystallography is examined. Key developments in the history of LEED are noted to illustrate the progress of the technique towards this goal, with an emphasis on the most recent developments. In contrast with X-ray crystallography it is shown that direct methods of data analysis are not satisfactory, at least at the present time, and thus trial-and-error model calculation comparisons are an essential part of LEED analysis. The number of variables which must he tested are generally fār fewer than in hulk crystallography, and methods of assigning constraints upon the models are discussed and illustrated. A scheme is suggested which would use feedback from successive model comparisons to increase the efficiency of the scanning process. Despite the development of many new techniques which are sensitive to surface structures, LEED is seen to have an important role to play in the near future. To this end, a number of important developments are discussed which may feature significantly in future studies.