Diffraction features in secondary electron emission

Abstract
Prominent features observed for energies between 100 and 600 eV in the secondary electron spectrum of stepped nickel surfaces are shown to have a strong dependence on the degree of surface disorder. Absorbed overlayers also strongly alter these structures. The effects of temperature and primary electron beam incident angle have been studied. Correlation between these features and structures in the integrated elastic intensity support an earlier suggestion that these features are caused by diffraction effects; a simple pseudokinematic scattering theory is used to further examine this suggestion. We have observed these diffraction features on a number of other materials. Their intensity is often as large as prominent Auger peaks so that caution must be exercised in the analysis of Auger peak shapes.

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