Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy
- 1 February 2001
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 40 (2B) , L170-173
- https://doi.org/10.1143/jjap.40.l170
Abstract
High-resolution transmission electron microscopy (HRTEM) has been developed to possess functions of atomic force microscopy and scanning tunneling microscopy. Dynamics of subnano Newton-scale force and conductance were simultaneously observed at intervals of 1/30–1/3840 s during HRTEM imaging of contact, deformation and fracture processes between nanometer-sized tips. The experimental basis of the atomic-scale mechanics of materials was developed on the basis of the present microscopy.Keywords
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