Long Term Operation of 4.5kV PiN and 2.5kV JBS Diodes

• 17 January 2001
• journal article
• conference paper
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 353-356, 727-730
• https://doi.org/10.4028/www.scientific.net/msf.353-356.727

Abstract

Keywords

• FORWARD DEGRADATION OF SIC DIODES
• HIGH VOLTAGE (HV)
• LARGE AREA DIODES
• RELIABILITY