Emissivity at 0.65 Micron of Silicon and Germanium at High Temperatures
- 1 December 1957
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 28 (12) , 1510-1511
- https://doi.org/10.1063/1.1722688
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Evaluation of the quality of a blackbodyPhysica, 1954
- Melting Point of High-Purity SiliconNature, 1938
- The True Temperature Scale of Tungsten and its Emissive Powers at Incandescent TemperaturesPhysical Review B, 1917