X.P.S. LINE BROADENING IN SMALL METAL PARTICLES

1 July 1977

journal article
Published by EDP Sciences in Le Journal de Physique Colloques

Vol. 38 (C2) , C2-125
https://doi.org/10.1051/jphyscol:1977225

Abstract

The X.P.S. line-width of discontinuous gold films is measured as a function of film thickness and is found to increase with decreasing particle's size. A theoretical explanation of this effect is proposed in terms of the reduced electronic screening of the final state core hole potential

Keywords

X.P.S
LINE BROADENING
SMALL METAL PARTICLES
BROADENING IN SMALL

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