A goniometer head for an atom-probe field ion microscope

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Abstract
With the goniometer head described, an area of about 0.1 nm2 on the surface of a metallic sample can be selected and analysed by means of a time-of-flight mass spectrometer. The coaxial geometry of the heat allows a voltage pulse to be transmitted with a rise time of 1 ns to the sample which can be cooled to about 20K in a vacuum better than 0.13 mu Pa (10-9 Torr). With a master clock of 200 MHz these features result in a mass accuracy of 1 part in 300.

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