Analysis of elliptically polarized light
- 1 September 1960
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 50 (9) , 892
- https://doi.org/10.1364/josa.50.000892
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- The determination of the refractive index and the thickness of thin films of aluminium oxide on aluminium by the polarimetric methodCzechoslovak Journal of Physics, 1954
- Analysis of Elliptical PolarizationJournal of the Optical Society of America, 1949
- Optical Compensators for Measurement of Elliptical PolarizationJournal of the Optical Society of America, 1948