EXAFS Studies of Liquid Semiconductors

1 January 1993

journal article
Published by IOP Publishing in Japanese Journal of Applied Physics

Vol. 32 (S2)
https://doi.org/10.7567/jjaps.32s2.165

Abstract

EXAFS is a useful probe of studying the local structure of disordered systems. We have developed a new sample cell and carried out EXAFS measurements for liquid semiconductors such as Se, Te and As₂Se₃, whose electronic properties often show metallic behaviour at high temperatures and pressures. EXAFS has been found to give useful information on the neighboring configuration around a central atom as long as the atoms are covalently bonded.

Keywords

SECURE
ONLINE
CREDIT
DEBIT
CARD
TRANSACTION
CLEARANCE

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