Pattern Recognition For Automatic Visual Inspection
- 22 November 1982
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
Abstract
Three major approaches to pattern recognition, (1) template matching, (2) decision-theoretic approach, and (3) structural and syntactic approach, are briefly introduced. The application of these approaches to automatic visual inspection of manufactured products are then reviewed. A more general method for automatic visual inspection of IC chips is then proposed. Several practical examples are included for illustration.Keywords
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