Secondary Emission from Films of Silver on Platinum
- 15 April 1940
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 57 (8) , 695-699
- https://doi.org/10.1103/physrev.57.695
Abstract
Total secondary emission and energy distribution of secondary electrons have been measured for films of known thickness of silver on platinum. The depth of origin of the total secondary emission in silver as a function of primary energy, and the depth of origin of secondaries having a given energy were determined. Practically all the secondaries from primaries of 20 ev energy originate at a depth of less than 15 atomic layers, and those from primaries of 50 ev energy originate at a depth of less than 30 atomic layers. For higher primary energies, it was found that an appreciable amount of emission comes from a depth greater than 150 atomic layers. Secondaries with energies close to that of the primaries originate at a depth small compared to that of the low energy secondaries.Keywords
This publication has 9 references indexed in Scilit:
- Secondary electron emission Part VI. The influence of externally adsorbedions and atoms on the secondary electron emission of metalsPhysica, 1939
- Secondary electron emission Part IV. Compounds with a high capacity for secondary electron emissionPhysica, 1939
- Total Secondary Electron Emission from Tungsten and Thorium-Coated TungstenPhysical Review B, 1939
- Secondary electron emission: Part II. Absorption of secondary electronsPhysica, 1938
- Secondary electron emissionPhysica, 1938
- Secondary-electron emission from complex surfacesProceedings of the Physical Society, 1937
- Secondary electron emission of metals with a low work function: Preliminary communicationPhysica, 1937
- The depth at which secondary electrons are liberatedPhysica, 1936
- Penetration of Low Speed Diffracted ElectronsPhysical Review B, 1936