UV written 1.5 μm reflection filters in single mode planar silica guides

• 22 October 1992
• journal article
• Published by Institution of Engineering and Technology (IET) in Electronics Letters
• Vol. 28  (22) , 2106-2107
• https://doi.org/10.1049/el:19921350

Abstract

Keywords

• GEO2-SIO2
• UV RADIATION EXPOSURE
• 1.5 MICRON
• UV WRITTEN
• REFLECTION FILTERS
• PLANAR SILICA GUIDES
• GRATING
• REACTIVE ION ETCHING
• SINGLE MODE
• H2 ANNEALING