Secondary Electron Emission from Thin-Film Gold-Metaloxide Cermets

Abstract
Measurements made on sputtered thin‐film gold‐metaloxide cermets indicate that the secondary electron emission yield is quite similar to that of the dielectric. For Au–Ta2O5 films, the first crossover potential is ≃ 30 V, and the maximum yield of 2.0 is achieved at 250 V. These values are essentially independent of the Au/Ta2O5 ratio. Results are also presented for Au–BaTiO3 and Au–Al2O3 cermets, and for pure Au as a reference. A brief tentative explanation of the experimental observations is given.

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