Radiation damage problems in electron microscopy
- 1 January 1980
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 15 (2) , 291-295
- https://doi.org/10.1051/rphysap:01980001502029100
Abstract
A brief outline is given of the processes of knock-on damage and electronic damage in electron microscopy together with estimates of the damage probabilities. Of the various remedial techniques under investigation, that of low temperature observation seems generally the most promising. Attention is drawn to some of the outstanding problems particularly concerning the nature and behaviour of electronic excitations in molecular crystals and their role in the damage mechanismKeywords
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