Thickness and roughness dependence of DC modulation noise in thin film magnetic recording disk media
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 26 (5) , 2712-2714
- https://doi.org/10.1109/20.104847
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- DC modulation noise and demagnetizing fields in thin metallic mediaIEEE Transactions on Magnetics, 1989
- Model for demagnetization-induced noise in thin-film magnetic recording mediaIEEE Transactions on Magnetics, 1988
- Density dependence of noise in thin metallic longitudinal mediaJournal of Applied Physics, 1988
- Time-domain model for noise from particulate recording mediaJournal of Applied Physics, 1987
- Erasure in particulate and thin-film disk mediaJournal of Applied Physics, 1987
- Noise in high performance thin-film longitudinal magnetic recording mediaIEEE Transactions on Magnetics, 1985
- The average power density spectrum of the readback voltage from particulate mediaIEEE Transactions on Magnetics, 1984
- Measurement of noise in magnetic mediaIEEE Transactions on Magnetics, 1983
- Statistical analysis of signal and noise in magnetic recordingIEEE Transactions on Magnetics, 1980
- Maximum signal-to-noise ratio of a tape recorderIEEE Transactions on Magnetics, 1969