Investigation of the compositional depth profile in epitaxial submicrometer layers ofAIIIBVheterostructures
- 1 October 1988
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 21 (5) , 386-392
- https://doi.org/10.1107/s0021889888003188
Abstract
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