3D mutifractal analysis: A new tool for epileptic fit sources detection in SPECT images
- 1 August 2008
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2008 (1094687X) , 3912-3915
- https://doi.org/10.1109/iembs.2008.4650065
Abstract
One of the imaging modalities used for the diagnosis of epilepsy is SPECT (Single-Photon Emission Computed Tomography). Ictal and interictal images are registered to MR images (SISCOM (Substracted Ictal Spect COregistred to MR) to delineate the sources. However, in some cases and for many reasons, the used method does not lead to precise delimitation of epileptic fit sources. In this case, works have been investigated on group's studies or in combining others modalities like EEG (Electroencephalography). This study investigates the possibility of using a mathematic model for the image texture to detect the changes on SPECT images. Beyond encouraging preliminary results concerning the multifractal analysis to distinguish volunteers and epileptic patients, our aim was to detect sources by the singularity spectrum compute. The experiment is divided into two phases. First, we developed a 3D method for the singularity spectrum compute. In the test phase, we applied this multifractal spectrum to the sources detection on SPECT images. The results obtained on a base of seven patients show that the proposed method is encouraging. Indeed, the detections of epileptic fit sources obtained were in agree with the expert diagnostic.Keywords
This publication has 15 references indexed in Scilit:
- Multifractal analysis of human retinal vesselsIEEE Transactions on Medical Imaging, 2006
- Morphology-based multifractal estimation for texture segmentationIEEE Transactions on Image Processing, 2006
- Automated detection of prostatic adenocarcinoma from high-resolution ex vivo MRIIEEE Transactions on Medical Imaging, 2005
- Classification of breast ultrasound images using fractal featureClinical Imaging, 2005
- Texture based MRI segmentation with a two-stage hybrid neural classifierPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- WAVELET-BASED MULTIFRACTAL FORMALISM TO ASSIST IN DIAGNOSIS IN DIGITIZED MAMMOGRAMSImage Analysis and Stereology, 2001
- Three-dimensional texture analysis of MRI brain datasetsIEEE Transactions on Medical Imaging, 2001
- Subtraction ictal SPECT co‐registered to MRI improves clinical usefulness of SPECT in localizing the surgical seizure focusNeurology, 1998
- Multifractal Analysis of Choquet CapacitiesAdvances in Applied Mathematics, 1998
- Texture Analysis of Ultrasonic Images of the Prostate by Means of Co-Occurrence MatricesUltrasonic Imaging, 1993